Additional Metadata
Publisher Cham: Springer
Editor J. F. van der Veen , J. F. van der Veen , M. A. Van Hove
Citation
MacDonald, J. E, Norris, C, Vlieg, E, Denier van der Gon, A. W, van der Veen, J. F, & van der Veen, J. F. (1988). Epitaxial growth studied by surface x-ray diffraction. In J. F van der Veen, J. F van der Veen, & M. A Van Hove (Eds.), The Structure of Surfaces II : Proceedings of the 2nd International Conference on the Structure of Surfaces (ICSOS II), Amsterdam, The Netherlands, June 22-25, 1987 (pp. 438–442). Cham: Springer.