Additional Metadata
Publisher Cham: Springer
Editor J.F. van der Veen , J.F. van der Veen , M.A. Van Hove
Citation
MacDonald, J.E, Norris, C, Vlieg, E, Denier van der Gon, A.W, van der Veen, J.F, & van der Veen, J.F. (1988). Epitaxial growth studied by surface x-ray diffraction. In J.F van der Veen, J.F van der Veen, & M.A Van Hove (Eds.), The Structure of Surfaces II : Proceedings of the 2nd International Conference on the Structure of Surfaces (ICSOS II), Amsterdam, The Netherlands, June 22-25, 1987 (pp. 438–442). Cham: Springer.