Additional Metadata
Journal Phys. Rev. B
Citation
Fischer, A. E. M. J, Gustafsson, T, & van der Veen, J. F. (1988). Determination of the atomic structure of the epitaxial CoSi2:Si (111) interface using high-resolution Rutherford backscattering. Phys. Rev. B, 37, 6305–6310.