Hosei University Press
T. Sebe , Y. Yamamoto

Marée, P. M. J, & van der Veen, J. F. (1988). Ion-scattering analysis of semiconductor films. In T Sebe & Y Yamamoto (Eds.), Application of Ion Beams in Materials Science : Proceedings of the 12th International Symposium of Hosei University, Tokyo, Japan, Sept. 2-4, 1987 (pp. 67–75). Hosei University Press.