Reflection extended x-ray absorption fine-structure measurement on Ni/C and NixSiy/C multilayered reflection coatings

1988

J. Vac. Sci. Technol. A , Volume 6 p. 2182- 2187

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Journal	J. Vac. Sci. Technol. A
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	van Brug, H, van der Wiel, M.J, van der Pol, R, Verhoeven, J, van der Laan, G, & Goedkoop, J.B. (1988). Reflection extended x-ray absorption fine-structure measurement on Ni/C and NixSiy/C multilayered reflection coatings. J. Vac. Sci. Technol. A, 6, 2182–2187.

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