Reflection extended x-ray absorption fine-structure measurement on Ni/C and NixSiy/C multilayered reflection coatings

1988-01-01

J. Vac. Sci. Technol. A , Volume 6 p. 2182- 2187

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Journal	J. Vac. Sci. Technol. A
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	van Brug, H, van der Wiel, M. J, van der Pol, R, Verhoeven, J, van der Laan, G, & Goedkoop, J. B. (1988). Reflection extended x-ray absorption fine-structure measurement on Ni/C and NixSiy/C multilayered reflection coatings. J. Vac. Sci. Technol. A, 6, 2182–2187.

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