Additional Metadata
Journal J. Vac. Sci. Technol. A
Citation
van Brug, H, van der Wiel, M. J, van der Pol, R, Verhoeven, J, van der Laan, G, & Goedkoop, J. B. (1988). Reflection extended x-ray absorption fine-structure measurement on Ni/C and NixSiy/C multilayered reflection coatings. J. Vac. Sci. Technol. A, 6, 2182–2187.