1988
Reflection extended x-ray absorption fine-structure measurement on Ni/C and NixSiy/C multilayered reflection coatings
Publication
Publication
J. Vac. Sci. Technol. A , Volume 6 p. 2182- 2187
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J. Vac. Sci. Technol. A | |
van Brug, H, van der Wiel, M. J, van der Pol, R, Verhoeven, J, van der Laan, G, & Goedkoop, J. B. (1988). Reflection extended x-ray absorption fine-structure measurement on Ni/C and NixSiy/C multilayered reflection coatings. J. Vac. Sci. Technol. A, 6, 2182–2187.
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