The role of small-impact-parameter electron-loss processes on ion temperatures measured by active-beam plasma diagnostics

1989

J. Appl. Phys. , Volume 65 p. 57- 63

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Journal	J. Appl. Phys.
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Donn, A. J. H., de Heer, F. J., & Olson, R. E. (1989). The role of small-impact-parameter electron-loss processes on ion temperatures measured by active-beam plasma diagnostics. J. Appl. Phys., 65, 57–63.

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