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A. Rizzi and W. F. J. Slijkerman

1989-01-01

Epitaxial growth and characterization of Si/NiSi2/Si(111) heterostructures

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Surf. Sci. , Volume 211/212 p. 620- 629

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Rizzi, A, & Slijkerman, W. F. J. (1989). Epitaxial growth and characterization of Si/NiSi2/Si(111) heterostructures. Surf. Sci., 211/212, 620–629.

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