The structure of the Si(111)(Ö3xÖ3)R30°-Sn surface determined using X-ray diffraction

1989-01-01

Surf. Sci. , Volume 215 p. 555- 565

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Journal	Surf. Sci.
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Conway, K. M, MacDonald, J. E, Norris, C, Vlieg, E, & van der Veen, J. F. (1989). The structure of the Si(111)(Ö3xÖ3)R30°-Sn surface determined using X-ray diffraction. Surf. Sci., 215, 555–565.

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