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Journal J. Appl. Phys.
Citation
Slijkerman, W. F. J, Fischer, A. E. M. J, van der Veen, J. F, Ohdomari, I, Yoshida, S, & Misawa, S. (1989). Formation of the Ni-SiC(001) interface studied by high-resolution ion backscattering. J. Appl. Phys., 66, 666–673.