1989
Formation of the Ni-SiC(001) interface studied by high-resolution ion backscattering
Publication
Publication
J. Appl. Phys. , Volume 66 p. 666- 673
Additional Metadata | |
---|---|
J. Appl. Phys. | |
Slijkerman, W. F. J, Fischer, A. E. M. J, van der Veen, J. F, Ohdomari, I, Yoshida, S, & Misawa, S. (1989). Formation of the Ni-SiC(001) interface studied by high-resolution ion backscattering. J. Appl. Phys., 66, 666–673.
|