The role of layer growth on interface roughness in Ni-C multilayer X-ray mirrors

1988-01-01

Vacuum , Volume 38 p. 707- 709

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Journal	Vacuum
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Puik, E. J, van der Wiel, M. J, Zeijlemaker, H, & Verhoeven, J. (1988). The role of layer growth on interface roughness in Ni-C multilayer X-ray mirrors. Vacuum, 38, 707–709.

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