The International Society for Optical Engineering
F.E. Christensen

Puik, E. J., van der Wiel, M. J., & Verhoeven, J. (1988). Layered synthetic multilayers for high resolution X-ray reflection in the 6 to 8 keV region. In F. E. Christensen (Ed.), X-ray Multilayers for Diffractometers, Monochromators, and Spectrometers : 17-19 August 1988, San Diego, California (pp. 111–118).