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E. Vlieg (Elias) and J.F. van der Veen

1989

X-ray scattering studies of semiconductor interfaces: atomic structure and morphology

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Appl. Surf. Sci. , Volume 41/42 p. 62- 69

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Journal Appl. Surf. Sci.
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Vlieg, E, & van der Veen, J.F. (1989). X-ray scattering studies of semiconductor interfaces: atomic structure and morphology. Appl. Surf. Sci., 41/42, 62–69.

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