X-ray scattering studies of semiconductor interfaces: atomic structure and morphology

1989-01-01

Appl. Surf. Sci. , Volume 41/42 p. 62- 69

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Journal	Appl. Surf. Sci.
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Vlieg, E, & van der Veen, J.F. (1989). X-ray scattering studies of semiconductor interfaces: atomic structure and morphology. Appl. Surf. Sci., 41/42, 62–69.

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