Range straggling of MeV ions in amorphous silicon: discrepancies with trim

1990-01-01

Nucl. Instrum. Methods Phys. Res. B , Volume 48 p. 448- 452

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Journal	Nucl. Instrum. Methods Phys. Res. B
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Schreutelkamp, R, Liefting, J. R, Zagwijn, P. M, Lu, W. X, & Saris, F.W. (1990). Range straggling of MeV ions in amorphous silicon: discrepancies with trim. Nucl. Instrum. Methods Phys. Res. B, 48, 448–452.

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