Defect states of amorphous Si probed by the diffusion and solubility of Cu

1990-01-01

Appl. Phys. Lett. , Volume 57 p. 1230- 1232

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Journal	Appl. Phys. Lett.
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Polman, A, Jacobson, D.C, Coffa, S, Poate, J.M, Roorda, S, & Sinke, W.C. (1990). Defect states of amorphous Si probed by the diffusion and solubility of Cu. Appl. Phys. Lett., 57, 1230–1232.

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