Defect states of amorphous Si probed by the diffusion and solubility of Cu

1990

Appl. Phys. Lett. , Volume 57 p. 1230- 1232

Additional Metadata
Journal	Appl. Phys. Lett.
Organisation	Photonic Materials
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Polman, A, Jacobson, D.C, Coffa, S, Poate, J.M, Roorda, S, & Sinke, W.C. (1990). Defect states of amorphous Si probed by the diffusion and solubility of Cu. Appl. Phys. Lett., 57, 1230–1232.

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