1990
Defect states of amorphous Si probed by the diffusion and solubility of Cu
Publication
Publication
Appl. Phys. Lett. , Volume 57 p. 1230- 1232
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Appl. Phys. Lett. | |
Organisation | Photonic Materials |
Polman, A, Jacobson, D.C, Coffa, S, Poate, J.M, Roorda, S, & Sinke, W.C. (1990). Defect states of amorphous Si probed by the diffusion and solubility of Cu. Appl. Phys. Lett., 57, 1230–1232.
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