Defect states of amorphous Si probed by the diffusion and solubility of Cu

1990

Appl. Phys. Lett. , Volume 57 p. 1230- 1232

Additional Metadata
Journal	Appl. Phys. Lett.
Organisation	Photonic Materials
Citation APA-ALL APA Style APA-ALL Style AAA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Polman, A., Jacobson, D. C., Coffa, S., Poate, J. M., Roorda, S.& Sinke, W. (1990). Defect states of amorphous Si probed by the diffusion and solubility of Cu. Appl. Phys. Lett., 57, 1230–1232.

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