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Journal Appl. Phys. Lett.
Citation
Polman, A, Jacobson, D.C, Coffa, S, Poate, J.M, Roorda, S, & Sinke, W.C. (1990). Defect states of amorphous Si probed by the diffusion and solubility of Cu. Appl. Phys. Lett., 57, 1230–1232.