Additional Metadata
Journal Phys. Rev. B
Citation
Vrijmoeth, J, van der Veen, J. F, Heslinga, D. R, & Klapwijk, T. M. (1990). Medium-energy ion-scattering study of a possible relation between the Schottky-barrier height and the defect density at NiSi2/Si(111) interfaces. Phys. Rev. B, 42, 9598–9608.