Structure of the Ge(111)-c(2x8) surface as determined form scattered X-ray intensities along crystal truncation rods

1990

Faraday Discuss. , Volume 89 p. 169- 180

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Journal	Faraday Discuss.
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	van Silfhout, R., van der Veen, J. F., Norris, C., & MacDonald, J. E. (1990). Structure of the Ge(111)-c(2x8) surface as determined form scattered X-ray intensities along crystal truncation rods. Faraday Discuss., 89, 169–180.

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