Material Research Society
T.C. Huang , P.I. Cohen , D.J. Eaglesham

Vlieg, E., Robinson, I. K., & van der Veen, J. F. (1991). X-ray diffraction from surfaces and interfaces: Atomic structure and morphology. In T. C. Huang, P. I. Cohen, & D. J. Eaglesham (Eds.), Advances in Surface and Thin Film Diffraction : Symposium held in November 27-29, 1990, Boston, Massachusetts, U.S.A. (pp. 169–177).