Additional Metadata
Publisher Material Research Society
Editor T.C. Huang , P.I. Cohen , D.J. Eaglesham
Citation
Vlieg, E, Robinson, I.K, & van der Veen, J.F. (1991). X-ray diffraction from surfaces and interfaces: Atomic structure and morphology. In T.C Huang, P.I Cohen, & D.J Eaglesham (Eds.), Advances in Surface and Thin Film Diffraction : Symposium held in November 27-29, 1990, Boston, Massachusetts, U.S.A. (pp. 169–177). Material Research Society.