Additional Metadata
Publisher Material Research Society
Editor T. C. Huang , P. I. Cohen , D. J. Eaglesham
Citation
Vrijmoeth, J, Zagwijn, P. M, Frenken, J. W. M, & van der Veen, J. F. (1991). Structure determination of the NiSi2(111) surface using medium energy ion scattering with monolayer resolution. In T. C Huang, P. I Cohen, & D. J Eaglesham (Eds.), Advances in Surface and Thin Film Diffraction : Symposium held in November 27-29, 1990, Boston, Massachusetts, U.S.A. (pp. 199–202). Material Research Society.