Material Research Society
T.C. Huang , P.I. Cohen , D.J. Eaglesham

Vrijmoeth, J., Zagwijn, P. M., Frenken, J. W. M., & van der Veen, J. F. (1991). Structure determination of the NiSi2(111) surface using medium energy ion scattering with monolayer resolution. In T. C. Huang, P. I. Cohen, & D. J. Eaglesham (Eds.), Advances in Surface and Thin Film Diffraction : Symposium held in November 27-29, 1990, Boston, Massachusetts, U.S.A. (pp. 199–202).