Structural relaxation and defect annihilation in pure amorphous silicon

1991-01-01

Phys. Rev. B , Volume 44 p. 3702- 3725

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Journal	Phys. Rev. B
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Roorda, S, Sinke, W.C, Poate, J.M, Jacobson, D.C, Dierker, S, Dennis, B.S, … Fuoss, P. (1991). Structural relaxation and defect annihilation in pure amorphous silicon. Phys. Rev. B, 44, 3702–3725.

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