Characterization of a multilayer coated laminar reflection grating at l = 0.154 nm

1991

J. X-Ray Sci. Technol. , Volume 3 p. 19- 34

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Journal	J. X-Ray Sci. Technol.
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Puik, E. J., van der Wiel, M. J., Lambooy, P., Verhoeven, J., Christensen, F. E., & Padmore, H. A. (1991). Characterization of a multilayer coated laminar reflection grating at l = 0.154 nm. J. X-Ray Sci. Technol., 3, 19–34.

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