Additional Metadata
Journal J. X-Ray Sci. Technol.
Citation
Puik, E. J, van der Wiel, M. J, Lambooy, P, Verhoeven, J, Christensen, F. E, & Padmore, H. A. (1991). Characterization of a multilayer coated laminar reflection grating at l = 0.154 nm. J. X-Ray Sci. Technol., 3, 19–34.