1992
Ion bombardment of thin layers: the effect on the interface roughness and its x-ray reflectivity (invited)
Publication
Publication
Rev. Sci. Instrum. , Volume 63 p. 1415- 1419
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Rev. Sci. Instrum. | |
Puik, E.J, van der Wiel, M.J, Zeijlemaker, H, & Verhoeven, J. (1992). Ion bombardment of thin layers: the effect on the interface roughness and its x-ray reflectivity (invited). Rev. Sci. Instrum., 63, 1415–1419.
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