Ion bombardment of thin layers: the effect on the interface roughness and its x-ray reflectivity (invited)

1992-01-01

Rev. Sci. Instrum. , Volume 63 p. 1415- 1419

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Journal	Rev. Sci. Instrum.
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Puik, E.J, van der Wiel, M.J, Zeijlemaker, H, & Verhoeven, J. (1992). Ion bombardment of thin layers: the effect on the interface roughness and its x-ray reflectivity (invited). Rev. Sci. Instrum., 63, 1415–1419.

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