Additional Metadata
Journal Rev. Sci. Instrum.
Citation
Puik, E. J, van der Wiel, M. J, Zeijlemaker, H, & Verhoeven, J. (1992). Ion bombardment of thin layers: the effect on the interface roughness and its x-ray reflectivity (invited). Rev. Sci. Instrum., 63, 1415–1419.