Additional Metadata
Publisher Institute of Physics
Editor A. G. Cullis , N. J. Long
Citation
MacDonald, J. E, Williams, A. A, Thornton, J. M. C, van Silfhout, R, van der Veen, J. F, Finney, M. S, & Norris, C. (1991). Grazing incidence X-ray diffraction studies of strain relaxation in monolayer-thick films. In A. G Cullis & N. J Long (Eds.), Microscopy of Semiconducting Materials 1991 : Proceedings of the Institute of Physics Conference, held at Oxford University, 25-28 march 1991 (pp. 645–650). Institute of Physics.