Institute of Physics
A.G. Cullis , N.J. Long

MacDonald, J. E., Williams, A. A., Thornton, J. M. C., van Silfhout, R., van der Veen, J. F., Finney, M. S., & Norris, C. (1991). Grazing incidence X-ray diffraction studies of strain relaxation in monolayer-thick films. In A. G. Cullis & N. J. Long (Eds.), Microscopy of Semiconducting Materials 1991 : Proceedings of the Institute of Physics Conference, held at Oxford University, 25-28 march 1991 (pp. 645–650).