Grazing incidence X-ray diffraction studies of strain relaxation in monolayer-thick films

1991-01-01

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Publisher	Institute of Physics
Editor	A. G. Cullis , N. J. Long
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	MacDonald, J. E, Williams, A. A, Thornton, J. M. C, van Silfhout, R, van der Veen, J. F, Finney, M. S, & Norris, C. (1991). Grazing incidence X-ray diffraction studies of strain relaxation in monolayer-thick films. In A. G Cullis & N. J Long (Eds.), Microscopy of Semiconducting Materials 1991 : Proceedings of the Institute of Physics Conference, held at Oxford University, 25-28 march 1991 (pp. 645–650). Institute of Physics.

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