Optical Society of America

Schlatmann, R., Lu, C., Verhoeven, J., Puik, E. J.& van der Wiel, M. J. (1992, January). Limits to ion beam etching of Mo/Si multilayer coatings. Physics of X-ray Multilayer Structures, March 2-5, 1992, Jackson Hole Wyoming, Addendum and Postdeadline Papers.