Optical Society of America

Schlatmann, R., Lu, C., Verhoeven, J., Puik, E. J., & van der Wiel, M. J. (1992). Limits to ion beam etching of Mo/Si multilayer coatings. In Physics of X-ray Multilayer Structures, March 2-5, 1992, Jackson Hole Wyoming, Addendum and Postdeadline Papers.