Ion beam modification of Mo-Si multilayer systems for X-ray reflection

1992-01-01

Appl. Surf. Sci. , Volume 55 p. 97- 103

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Journal	Appl. Surf. Sci.
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Verhoeven, J, Chunguang, L, Puik, E. J, van der Wiel, M. J, & Huijgen, T. P. (1992). Ion beam modification of Mo-Si multilayer systems for X-ray reflection. Appl. Surf. Sci., 55, 97–103.

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