Defects in amorphous silicon probed by subpicosecond photocarrier dynamics

1992-01-01

Appl. Phys. Lett. , Volume 60 p. 1688- 1690

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Journal	Appl. Phys. Lett.
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Stolk, P.A, Calcagnile, L, Roorda, S, Sinke, W.C, Berntsen, A, & van der Weg, W.F. (1992). Defects in amorphous silicon probed by subpicosecond photocarrier dynamics. Appl. Phys. Lett., 60, 1688–1690.

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