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Journal Appl. Phys. Lett.
Citation
Stolk, P.A, Calcagnile, L, Roorda, S, Sinke, W.C, Berntsen, A, & van der Weg, W.F. (1992). Defects in amorphous silicon probed by subpicosecond photocarrier dynamics. Appl. Phys. Lett., 60, 1688–1690.