Evidence for vacancies in amorphous silicon

1992-01-01

Phys. Rev. Lett. , Volume 68 p. 3714- 3717

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Journal	Phys. Rev. Lett.
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	van den Hoven, G. N, Liang, Z. N, Niesen, L, & Custer, J. S. (1992). Evidence for vacancies in amorphous silicon. Phys.Rev.Lett., 68, 3714–3717.

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