Vacancy-type and electrical defects in amorphous silicon probed by positrons and electrons

1992

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Publisher	Materials Research Society
Editor	G. S. Was , L. E. Rehn , D. M. Follstaedt
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Roorda, S, Hakvoort, R. A, van Veen, A, Stolk, P. A, & Saris, F.W. (1992). Vacancy-type and electrical defects in amorphous silicon probed by positrons and electrons. In G. S Was, L. E Rehn, & D. M Follstaedt (Eds.), Phase Formation and Modification by Beam-Solid Interactions : Symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A. (pp. 39–44). Materials Research Society.

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