Structural and electrical defects in amorphous silicon probed by positrons and electrons

1992

J. Appl. Phys. , Volume 72 p. 5145- 5152

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Journal	J. Appl. Phys.
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Roorda, S., Hakvoort, R. A., van Veen, A., Stolk, P. A., & Saris, F. W. (1992). Structural and electrical defects in amorphous silicon probed by positrons and electrons. J. Appl. Phys., 72, 5145–5152.

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