Parasitic effects in an imperfectly manufactured inhomogeneous Wien filter

Based on the formulae obtained for the electromagnetic field disturbance in an imperfectly manufactured Wien filter, the equations for ion trajectories were derived and investigated. It is shown that the first order main path deviation and radial angular defocusing due to parasitic effects may be compensated for by small field variations from the electronic supplies. Image defects resulting from field imperfections affecting the Wien filter symmetry with respect to the median plane cannot be corrected by field intensity changes.