1995
Surface X-ray crystallography of growing crystals and interfaces
Publication
Publication
Nucl. Instrum. Methods Phys. Res. B , Volume 97 p. 358- 363
The technique of surface X-ray diffraction is briefly introduced. By discussing two examples, the homoepitaxial growth of Ag crystals and the formation of erbium silicide on Si(111), it is demonstrated that X-ray diffraction allows the determination of both structure and morphology at surfaces and interfaces.
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Nucl. Instrum. Methods Phys. Res. B | |
Vlieg, E, Lohmeier, M, & van der Vegt, H.A. (1995). Surface X-ray crystallography of growing crystals and interfaces. Nucl. Instrum. Methods Phys. Res. B, 97, 358–363.
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