Design and performance of a high-temperature, high-speed scanning tunneling microscope
Rev. Sci. Instrum. , Volume 66 p. 4557- 4565
This article describes the design and performance of a new scanning tunneling microscope (STM) which operates at elevated temperatures and high scanning speeds. To minimize the thermal displacements within the STM, a symmetric configuration was chosen with a large temperature gradient between the sample and the piezoelectric scanner. The thermal behavior of the STM was optimized further by means of a finite element analysis. The high scan rates (105 data points/s) are accomplished with fast analogue electronics and a combination of a workstation and three transputers. The STM has imaged surfaces with atomic resolution between room temperature and 750 K, with low residual drifts only two hours after a major temperature change. The sample surface remains within the vertical range of the piezo actuator over a temperature interval of 159 K.
|Rev. Sci. Instrum.|
Kuipers, L.K, Loos, R.W.M, Neerings, H, ter Horst, J, Ruwiel, G.J, de Jongh, A.P, & Frenken, J.W.M. (1995). Design and performance of a high-temperature, high-speed scanning tunneling microscope. Rev. Sci. Instrum., 66, 4557–4565.