Atomic structure of the c(4 x 2) surface reconstruction of Ge(001) as determined by X-ray diffraction
Phys. Rev. Lett. , Volume 75 p. 1771- 1774
The c(4 X 2) reconstruction of Ge(001) has been studied by x-ray diffraction of 150 K by measuring in-plane reflections and out-of-plane intensities of fractional order rods. The structure consists of an alternate arrangement of buckled dimers (tilt angle 19° • 1°) along the  and  surface directions. The dimer rows are not straight along the  direction but show a slight zigzag with an amplitude of 0.340 • 0.005 Å.
|Phys. Rev. Lett.|
Ferrer, S, Torrelles, X, Etgens, V. H, van der Vegt, H. A, & Fajardo, P. (1995). Atomic structure of the c(4 x 2) surface reconstruction of Ge(001) as determined by X-ray diffraction. Phys.Rev.Lett., 75, 1771–1774.