We present a grazing incidence x-ray diffraction surface structure determination on a II-VI compound namely, the CdEe(001) C(2x2) reconstructed surface grown by molecular beam epitaxy. The structural analysis leads to a model with cadmium bridges corresponding to a coverage of 0.5 ML Cd, as expected from previous studies. This surface arrangement is accompanied by a significant relaxation of the underlying substrate down to the sixth atomic layer. Moreover, a strong anisotropy of the reconstructed domain dimensions is observed and quantified. This findings may explain the anisotropic behavior observed during homoepitaxial and heteroepitaxial growth on CdTe.

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Journal Appl. Phys. Lett.
Veron, M. B, Sauvage-Simkin, M, Etgens, V. H, Tatarenko, S, van der Vegt, H. A, & Ferrer, S. (1995). Atomic structure of the CdTe(001) C(2x2) reconstructed surface: a grazing incidence x-ray diffraction study. Appl. Phys. Lett., 67, 3957–3959.