The resolution function in diffuse X-ray reflectivity
J. Appl. Crystallogr. , Volume 29 p. 511- 515
A comprehensive discussion of the resolution function in specular and diffuse X-ray reflectivity is given. This is particularly relevant due to the proliferation of this technique in the field of liquid and solid surfaces and multilayer systems. A simple quantitatively correct interpretation of the diffuse reflectivity is possible if the resolution function is separable for the two directions in the scattering plane. This can be accomplished using a symmetric resolution set-up and specific types of scans (so-called radial scans and rocking scans).
|J. Appl. Crystallogr.|
de Jeu, W. H, Shindler, J. D, & Mol, E. A. L. (1996). The resolution function in diffuse X-ray reflectivity. J. Appl. Crystallogr., 29, 511–515.