Synchrotron radiation sources are increasingly being used for X-ray diffraction experiments on surfaces, solid-solid interfaces and solid-liquid buried interfaces. We review the basic principles of X-ray diffraction from truncated crystal lattices and demonstrate how this technique is used for the determination of their structure and atomic-scale roughness. We have selected two examples: the interface between crystalline and amorphized Si(001) and the interface between liquid Ga and diamond(111).

Additional Metadata
Publisher [s.n.]
Editor M. Kitajima , H. Haneda , K. Ishioka , K. Hirata
Citation
van der Veen, J.F, Vlieg, E, & Huisman, W.J. (1996). X-ray diffraction from surfaces and interfaces. In M Kitajima, H Haneda, K Ishioka, & K Hirata (Eds.), Proceedings of the International Symposium on Material Chemistry in Nuclear Environment : Material Chemistry '96, March 14-15, 1996 National Research Institute for Metals, Tsukuba, Japan (pp. 43–51). [s.n.].