Spatially resolved surface analysis in an ion trap mass spectrometer with an external ion source
A new laser microprobe mass spectrometer (LMMS) has been developed on an Ion Trap Mass Spectrometer (Bruker Instruments) with an external ion source with the aim the determine organic composition of heterogeneous solid surfaces with spatially resolution. The surfaces are pre-examined by light and IR imaging techniques which are linked to the experiment. These spectroscopic image maps of the surface are used to drive the sample manipulator and direct the spatial selection process in the LMMS. As a result the spectroscopic information and molecular information is combined in one analytical run. This chemical microscope will be used by a team of physicists, chemists and art historians for the study of the chemical composition of 13-19th century paintings.
van Rooij, G.J, Heeren, R.M.A, Wyplosz, N, & Boon, J.J. (1997). Spatially resolved surface analysis in an ion trap mass spectrometer with an external ion source. In Proceedings ASMS : The 45th ASMS Conference on Mass Spectrometry and Allied Topics, June 1-5, 1997, Palm Springs, California. [s.n.].