We demonstrate nanoscale photonic point-to-point measurements characterizing a single component inside an all-optical signal-processing chip. We perform spectrally-resolved nearfield scanning optical microscopy on ultrashort pulses propagating inside a slow light photonic crystal waveguide, which is part of a composite sample. A power study reveals a reshaping of the pulse's spectral density, which we model using the nonlinear Schrödinger equation. With the model we are able to identify the various physical processes governing the nonlinear pulse propagation. Finally, we contrast the near-field measurements with transmission measurements of the complete composite sample to elucidate the importance of gaining local information about the evolution of the spectral density.

Additional Metadata
Publisher ACS
Reviewer A. Bakulin
Persistent URL dx.doi.org/10.1021/nl4026456
Journal Nano Lett.
Wulf, M, Beggs, D. M, Rotenberg, N, & Kuipers, L. (2013). Unravelling nonlinear spectral evolution using nanoscale photonic near-field point-to-point measurements. Nano Lett., 13(12), 5858–5865. doi:10.1021/nl4026456