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Additional Metadata
Persistent URL dx.doi.org/10.1063/1.1773927
Journal Appl. Phys. Lett.
Citation
van Dillen, T, Siem, M.Y.S, & Polman, A. (2004). Stress map for ion irradiation: depth-resolved dynamic competition between radiation-induced viscoelastic phenomena in SiO2. Appl. Phys. Lett., 85, 389–391. doi:10.1063/1.1773927