Stress map for ion irradiation: depth-resolved dynamic competition between radiation-induced viscoelastic phenomena in SiO2

2004

Appl. Phys. Lett. , Volume 85 p. 389- 391

Additional Metadata
Persistent URL	doi.org/10.1063/1.1773927
Journal	Appl. Phys. Lett.
Organisation	Photonic Materials
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	van Dillen, T., Siem, M. Y. S., & Polman, A. (2004). Stress map for ion irradiation: depth-resolved dynamic competition between radiation-induced viscoelastic phenomena in SiO2. Appl. Phys. Lett., 85, 389–391. doi:10.1063/1.1773927

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